-
Spectroscopy:
Angle Resolved Photoemission Spectroscopy (ARPES)
Spin-resolved Photoemission Spectroscopy (Spin-ARPES)
Extended X-ray Absorption Fine Structure (EXAFS)
-
Imaging:
Spin Polarized Low Energy Electron
Microscopy (SPLEEM)
-
Scattering:
Inelastic X-ray
Scattering (IXS)
These
probes allow us to gain information on the real and momentum space of materials
and to probe their electronic, crystallographic and magnetic structure.
Experiments
are carried out both in
our laboratory,
at the
Advanced Light Source,
at the European Synchrotron Radiation Facility
and at
the
National Center for Electron Microscopy
at LBNL.
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