Advances in Precision Measurement with Electron Microscopy

Monday, March 11, 2019 - 2:30pm

This seminar will discuss recent advancements in measurement with electron microscopy. While a single image from a high-resolution electron microscope can determine can 2D positional information with sub-angstrom resolution, only recently has been it become possible to determine individual atomic coordinates in 3D. The application of this method to nanomaterials containing defects and strain will be discussed, as well as upcoming and future capabilities in electron detection, measurement metrology and sample environments.
 

Location: 
106 Stanley Hall
Speaker: 
Affiliation: 
Department of Materials Science and Engineering, UC Berkeley